0.25s/point acquisition time (spot size ~ 1mm) | ||
Immunity to vibration and stray light if modulation scheme is employed | ||
Excellent value | ||
Straightforward integration into the production line |
Optical path difference (OPD) between dashed | ||
and solid ray is zero |
Some light is scattered by the rough features | ||
Sample scatters light in diffuse manner |
The system operates on the ideal that even rough surfaces tend to reflect light well when | ||
viewed at oblique angles. |
Low incidence angle: The rough wafer appears matte (Paper-like white surface) | ||
High incidence angle: The same rough wafer acts as a reflective surface | ||