Projection Tool for Topography and QE Uniformity
Spectral Mapping Characterisation
Dimensional and Stress Metrology for Bow, and Warp,
measurements on crystalline, thin film materials,
and minipanels.
New metrology for X-ray mirrors (see Video demo).
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology
Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1m , 2 m x 2 m, and larger glass).
Spectral Mapping Characterisation
Dimensional and Stress Metrology for Bow, and Warp,
measurements on crystalline, thin film materials,
and minipanels.
New metrology for X-ray mirrors (see Video demo).
Quantum Efficiency (QE) Uniformity measurements,
using white light and color scanner technology
Glass Bow, Roller Wave, full Glass substrate scalable
metrology (0.5 m x 1m , 2 m x 2 m, and larger glass).
Interferometric Probe a Non Contact Wafer
Thickness and Wafer Topo- and Tomography
Low Coherence Metrology for
-wafer thickness measurement
-trench depth measurement
-membrane thickness measurement
-laser and LED application
-MEMs tomography applications
For Measurement videos on selected models please click
here.
Please contact us for detailed application notes at
sales@zebraoptical.com .
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ZebraOptical Optoprofiler