Dimensional and Stress Metrology for Bow and Warp measurements
on crystalline, thin film materials, and minipanels.

New metrology for
X-ray mirrors (Video demo).

Quantum Efficiency (QE) Uniformity measurements, using white light
and color scanner technology.

Glass Bow, Roller Wave, full Glass substrate scalable metrology (0.5
m x 1 m, 2 m x 2 m, and larger glass.
Interferometric Probe a Non Contact Wafer Thickness and Wafer Topo- and Tomography
Low Coherence Metrology for:
For Measurement videos on selected models please click here.
Please contact us for application notes at sales@zebraoptical.com
ZebraOptical Optoprofiler
Wafer thickness measurement
Trench depth measurement
Membrane thickness measurement
Laser and LED application
MEMs tomography applications
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